By Vince Slatford on 28 Sep 2018
OUR SIMS CONFERENCE REVIEW
One Education were proud to host their second SIMS annual conference at the Etihad stadium on the 25th September 2018. The conference was well attended by schools across Manchester with the majority of delegates being headteachers and business managers.
Updates and networking opportunities
The day began with a welcome from One Education's CEO Kieran McDermott and was followed by important updates on SIMS Accountability, Attendance and Assessment presented by Steve Long from Capita.
Delegates were then able to network and share best practice over lunch with colleagues and talk to external representatives showcasing a range of innovative ICT products available to schools.
Safeguarding solutions for schools
The afternoon began with an informative session from a range of our partners discussing a number of safeguarding solutions for schools. Keynote speakers from Sophos (Paul Ducklin), Impero (Courtney Goodsell), Parentapps (Kevin Clayton) and One Education (Mark Seddon) all discussed ways schools can keep their pupils and data safe through the use of effective ICT.
Delegates were then treated to a preview of Capita’s new hosted FMS (Financial Management System) solution with excellent feedback from those attending and seeing it for the first time.
Due to the timing of the conference, we ended the day with a refreshers of the changes and requirements of the upcoming school census presented by One Education’s Vanessa Fraser.
We would like to thank all the delegates that completed a questionnaire this will help us improve our services and congratulations to Mount Carmel who were presented with an iPad for their efforts.
Many thanks again to all those who attended on the day and hope you enjoyed it as much as we did.
If you would like to see our upcoming events and conferences, visit our Events & CPD webpage.
Our SIMS / ICT department offer the support and solutions you need to meet your ICT requirements.
Please get in touch or visit this page for more information.